The CIS is an integrated imaging system designed for inline industrial inspection. It combines image sensors, optics, illumination, and digital interfaces in a single, compact structure, ensuring high stability, vibration resistance, and easy integration even in small spaces.
Based on 1:1 scale acquisition, CIS enables images free of perspective distortion and easier handling than multi-camera systems. The range is available in configurations from 108 mm to 6000 mm and can be customized for scan width, resolution, speed, working distance, illumination, and interface to cover a wide variety of AOI applications.

















